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發表於 2008-11-26 21:59:05
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IV. CONCLUSION! I7 a; s7 A' u( d
The designs with 3-stage-inverter and 1-stage-inverter) N) W) k0 E }/ }3 n$ \
controlling circuits have been studied to verify the optimal4 j+ K1 E C0 d2 L# x& X
design schemes in NMOS-based power-rail ESD clamp. u/ k8 A, C4 ^7 a. d% Y
circuits. In addition, two ESD clamp NMOS transistors,
' H+ a" A/ a4 o6 e6 @4 `having snapback and no snapback operations, also were codesigned
4 h K3 R9 ?( k7 Cwith different controlling circuits to realize the1 S3 O" Y- @0 r# |1 `* O
impact on their required performance. According to the
* y/ D2 w% P" Mexperiments and analyses, the 3-stage inverters can slightly
) j0 T' n( [" h/ yincrease the ESD robustness, but they also can dramatically
0 ~- E# L% }" lsacrifice the mis-trigger and latch-on immunity. The 1-stage
7 H$ a" w0 M# W5 W7 Winverter should be an appropriate and reliable candidate for the
6 K8 [1 ~! p1 P8 cpower-rail ESD clamp circuits. |
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