|
就是这本书的作者!
On-Chip ESD Protection for Integrated Circuits7 n0 M, ?3 y0 t3 S- h
An IC Design Perspective
& }8 A" L- _" G o! I" A" b* B6 |9 j& C
' @6 }% n- \0 K. G# Vby2 H/ J# m7 M7 _0 l9 i5 u. r
Albert Z.H. Wang
M7 B: k% R1 r0 Z$ S* aIllinois Institute of Technology, Chicago, USA4 K0 y! @2 i7 v# j: n& c
& n, T4 `. O- E. [5 |/ s: K
Dedication. 1 `5 c( p- w; C
Acknowledgements.
. n$ U( ~2 R; \2 fPreface. 8 y) c. w3 q, L$ v
1. Introduction. 2. ESD Test Models. 3. ESD Pr* }$ V$ J% q: h0 ~4 g3 Y- O# d
Device Solutions. 4. ESD Protection Circuit Solutions. 5. Advanced ESD Protection; Mixe1 X# O& W s# F% f9 I4 f
and Whole-Chip ESD Protection. 6. ESD Failure Analysis and Modeling. 7. Layout and Te% l2 Z D9 Y' F- \$ ^+ V
Influences on ESD Protection Circuit Design. 8. ESD Simulation-Design Methodologies. 9* w) [0 Z: l$ b3 |' w* Q+ `
Circuit Interactions. 10. Conclusion Remarks and Future Work. / p: \ a" V& o
Appendix A: Summary fo; a( [8 T' R% i8 V# ]; k" g
Standards. References.
# A! [5 }% L* ^9 _/ n- HAppendix B: Commercial ESD Testing Systems. 2 x7 R; X6 a. i
Appendix C: E! @$ ?& I- t0 P: C) B
Protection Circuit Design Checklist. Index. |
|