ESD的另一种情况：CDE（Cable Discharge Event）

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ESD的另一种情况：CDE
" }1 m& x1 ]  `& q: X. K8 [% I6 S; ^- QCDE--Cable Discharge Event

Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology
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Abstract—Cable discharge events (CDEs) have been found
2 r5 k7 R5 J. O to be the major root cause of inducing hardware damage on
2 ^* Q# {+ [% N) Y8 C7 H) z Ethernet ICs of communication interfaces in real applications. Still,
there is no device-level evaluation method to investigate the ro
7 B' _2 J& s$ n; Z bustness of complementary metal–oxide–semiconductor (CMOS)
devices against a CDE for a layout optimization in silicon chips.

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