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發表於 2008-11-6 20:40:28
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Abstract—Cable discharge events (CDEs) have been found, U' U0 T- [ P3 O! h
to be the major root cause of inducing hardware damage on$ R! o/ Z! u5 G
Ethernet ICs of communication interfaces in real applications. Still,2 v% o, j* u# ^3 X
there is no device-level evaluation method to investigate the ro4 c' H3 Z! L5 _5 a+ G( V& z" `( Y
bustness of complementary metal–oxide–semiconductor (CMOS)' ]2 Q2 Q0 y7 o: E
devices against a CDE for a layout optimization in silicon chips. |
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