Abstract—Cable discharge events (CDEs) have been found ( o6 b) L _( [/ ]( B0 c$ X to be the major root cause of inducing hardware damage on 9 i' K# x( D. }0 y8 y+ V, N Ethernet ICs of communication interfaces in real applications. Still,+ Z4 a% M! O$ H8 K5 u2 o% Q# z
there is no device-level evaluation method to investigate the ro $ z/ p0 T( f5 a" s* {5 k9 ` bustness of complementary metal–oxide–semiconductor (CMOS)4 S b8 i& d7 Q$ V2 H Z; j
devices against a CDE for a layout optimization in silicon chips.