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發表於 2008-9-12 11:18:59
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ABCs of Probes
Table of Contents
$ h6 t& ~9 Y/ m Q7 }' }8 ^1 BProbes – The Critical Link To Measurement Quality . . . . . . . . .5
5 t Q2 S7 J4 i" CWhat is a Probe? . . . . . .5
_, t! N4 P% {: @# p, eThe Ideal Probe . . . . . . .65 A* ~% x4 J% S/ I. I% I5 i, ]
The Realities of Probes . 7
0 G, _" P; F" w7 n: [* r. HChoosing the Right Probe .10+ U4 m/ i5 t! e& }" |. W. z0 G7 p
Some Probing Tips . . . .11
; F9 y7 s3 u% {: eSummary 12- P( W5 N ?( Y: i/ J# ]; S- \
Different Probes for Different Needs . . . . . . . . .138 [& p! L' m6 Q! q5 C b5 j
Why So Many Probes? .13
/ ~8 N9 r9 c* RDifferent Probe Types and Their Benefits . . . . . . . .149 j. U+ S$ b5 b/ Y4 h9 I! Y2 Z
Floating Measurements .19) ?6 x* _1 R7 X$ X% `4 M6 N% a/ a
Probe Accessories . . . .20; e+ ?7 L* l$ Z/ E" y
How Probes Affect Your Measurements . . . . . . 22
' f L- R% e! w& [' @& cThe Effect of Source Impedance . . . . .220 t) ^4 O! t! r! T" o8 ^5 z% K' D
Capacitive Loading . . . .223 D0 u1 ~! @( J
Bandwidth Considerations 24
* a" n: l: ?9 x3 J v+ OWhat To Do About Probing Effects . . . .28
' ^5 O, S& l7 O1 VUnderstanding Probe Specifications . . . . . . . .29
! {) @% _4 s2 d! [3 zAberrations (universal) . 29; a$ W; x; j( ^8 u( x
Amp-Second Product (current probes) .29
% j8 ?( g& o9 ^# {$ IAttenuation Factor (universal) . . . . . . .29) J3 Q) }* ^ F# {" J
Accuracy (universal) . . .29$ A4 V- e, {* b. O
Bandwidth (universal) . .307 |" @: [& w! e3 k1 N0 b- D
Capacitance (universal) .30
& z" F, G% M% C/ x4 O: OCMRR (differential probes) . . . . . . . . .30
7 G& \4 B i' Y/ n: _- B" g* ]7 W( ICW Frequency Current Derating (current probes) . . .31
2 l2 H; u; f; e4 y+ H) R7 tDecay Time Constant (current probes) .31 K3 X9 ]4 ?. ~6 O# L) H
Direct Current (current probes) . . . . . .31" x y# q# g' n6 _3 p, p3 b, m
Insertion Impedance (current probes) . .31
& x9 a8 F" C$ b1 X" j0 iInput Capacitance (universal) . . . . . . . .31
1 N7 W! [5 L: c3 \Input Resistance (universal) . . . . . . . . .31/ C; \0 M m: x9 R# x, a% |
Maximum Input Current Rating (current probes) . . .31% m- E. t/ s1 D. r
Maximum Peak Pulse Current Rating (current probes) .31
4 w' }1 w+ [. ?2 o! DMaximum Voltage Rating (universal) . . .31
. q2 f0 K( S' ?' Q/ X* D6 \Propagation Delay (universal) . . . . . . .31/ |, p: ~. e: M* ^- s1 c
Rise Time (universal) . .31
; f- n0 J) t; ^* T+ i. l# ZTangential Noise (active probes) . . . . .31
9 d2 h# J) }/ _5 B' M9 b$ \Temperature Range (universal) . . . . . .313 j5 x0 }- E# W/ G- C' q
A Guide to Probe Selection . . . . . . .32" u; h n% b0 p& B% Z1 [" H, E! F
Understanding the Signal Source . . . . .32
+ M+ t4 v7 y6 R5 ~& AOscilloscope Issues . . .34& |4 `1 u" F# S N+ N# J
Selecting the Right Probe 35
5 p. }+ s9 z7 Z( h% ]Advanced Probing Techniques . . . .36' G! b# V3 \! t2 i
Ground Lead Issues . . .369 h9 }# e' y' S5 h& T! G% |7 D
Differential Measurements . . . . . . . . .39% I' }" h9 l$ r4 [6 R
Small Signal Measurements . . . . . . . . 42
. s' ^4 Z3 z1 Z) p2 vExplanation of Safety Precautions .44. E! J+ K0 P X6 j
Observe All Terminal Ratings . . . . . . . 44
3 g, H3 B1 N+ K" ~" J7 bUse Proper Grounding Procedures . . . .44
4 c/ q, D: r7 _ p- b% aConnect and Disconnect Probes Properly . . . . . . . .44
" q9 T: v* j' M- UAvoid Exposed Circuitry . .45
2 w" b \: ]1 I" w: h2 ?: g: ]+ wAvoid RF Burns While Handling Probes .45
" |7 l; P, i! ^7 d2 p# k4 sDo Not Operate Without Covers . . . . . .45
/ l3 ]0 w( P% w* J- }, l( oDo Not Operate in Wet/Damp Conditions . . . . . . . .450 x# L, a8 F4 P4 w. j) ^& Q
Do Not Operate in an Explosive Atmosphere . . . . . .45
" k1 L0 O& B& J4 dDo Not Operate with Suspected Failures . . . . . . . . .45
! l- X9 k# P M6 t7 o0 g; }Keep Probe Surfaces Clean and Dry . . .45
5 z4 ^% l! a9 Y+ d. w/ [# D7 \Do Not Immerse Probes in Liquids . . . .45
1 c- u9 b3 \3 {Glossary. y7 H' _" e; ~2 _- }) f% ~# s4 D
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