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[好康相報] 9/16 2011 無線終端產品量測技術研討會

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發表於 2011-8-31 12:15:01 | 只看該作者 回帖獎勵 |正序瀏覽 |閱讀模式
-無線終端產品測試:SAR、OTA、4G、HAC & EMI/ESD
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* R. f* M, K. x- ^為探討全球性通信資訊市場發展趨勢,使業界先進對電磁量測儀表(DASY, iSAR, OTA等)更廣泛瞭解,並熟悉相關配套量測工具之實際操作情形,及介紹新一代行動無線寬頻技術。耀豋科技秉持服務客戶精神,於2011年首度舉辦「無線終端產品量測技術研討會」,於會中分享CTIA最新法規與發展、SAR, HAC, LTE, NFC測量技術及最新測試功能,誠摯邀請您與我們共襄盛舉!
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主辦單位:Schmid & Partner Engineering AG, Aplustech AT4 wireless,  Auden Techno. Corp. 耀登科技股份有限公司   
% v1 z7 Y5 u; z# u5 p' i【會議地點及時間】:       
6 U2 i' \1 g  ?7 n" \. [( IDate: 16.September.2011 (Friday)
1 V0 x. E" ?& T4 U- L& t9 RTime: 9:00 AM ~ 17:30 PM3 W( V$ F% a* ]" {+ y
Location:Grand Victoria Hotel- 168 Jing Ye 4th Rd, Taipei 104  TEL02)8502-0000  
: n3 }# x/ K" }: v" e6 xContact information: Auden Techno. Corp. Equipment Marketing Dept.
& R3 ~& b' u1 |       TEL: (03) 3631901 or E-mail Ins@auden.com.tw
( P8 W5 a, ^% ], x       Ext: 134 Stella  E-mail: Stella.huang@auden.com.tw
$ ]- c* D  q. U( J  j0 A% P' ^+ V7 G活動費用: 全程免費(提供午餐餐盒、講義、茶點、水果)
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 樓主| 發表於 2011-8-31 12:15:29 | 只看該作者

Time

16. September. 2011 (Friday)-Taiwan

Speaker

9:00-9:30

Registration & Coffee

9:30-9:40

Opening

Daniel Chang

9:40-10:00

Topic SAR-1

Current status and future direction of SAR & HAC measurement standards:
* T1 w" k* T2 t- \0 CSpecific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232

Dr. Mark Douglas

10:00-10:30

Topic SAR-2

The present SAR regulation & newest information in Japan

Dr. Nobuhiro Nakanishi

10:30-10:50

Coffee Break 

10:50:11:20

Topic SAR-3

TAF Proficiency Test Requirement, take SAR for example.

Roger Sheng

11:20-11:40

Topic SAR-4

Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap phantom and whole-body phantoms, base-station phantoms

Prof. Niels Kuster

11:40-12:00

Topic SAR-5

New advances in fast, reliable SAR measurement techniques

Dr. Mark Douglas

12:00-12:20

Topic SAR-6

Obtaining high-precision dielectric material characterization of liquids and solids

Dr. Mark Douglas

12:20-13:30

Lunch & DAK Demo 

13:30-13:45

Topic OTA-1

Current status and future direction of CTIA 3.1 & 3GPP

Prof. Niels Kuster

13:45-14:25

Topic OTA-2

PART I - CTIA OTA TEST SYSTEM
/ ?" x( F& b3 M9 U$ TPART II - APLUSTECH PRODUCT
9 q" t( w2 S, }5 HPART III - MIMO ANTENNA TEST

Kyung-ki Min

14:25-14:40

Topic OTA-3

Novel OTA Phantoms

Prof. Niels Kuster

14:40-15:10

Topic 4G-1

NFC Testing Challenges
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NFC Technology Main Features
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! e6 h  h5 t. r' u0 [+ aNFC Testing Challenges" T8 \5 w5 U8 f( |6 J
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NFC Forum Compliance Activities' Y" S$ `' U& b1 E4 n8 [
-
0 a1 \8 I4 J. D9 x8 K  {RIDER RFID HF Tester

Rafael Garcia Escobar

15:10-15:30

Coffee Break 

15:30-16:00

Topic 4G-2

LTE R&D Testing1 _4 L# b3 P+ v$ x1 S
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LTE Design Verification Testing
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Needed functionalities for R&D Testing
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+ t6 d  \- b6 c, b) X4 JLTE Mobile Application Usage Cases
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LTE RF Design Validation Tester

Rafael Garcia Escobar

16:00-16:20

Topic 4G-3

SAR Measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems)

Prof. Niels Kuster

16:20-16:40

Topic HAC-1

Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment

Dr. Fin Bomholt

16:40-17:10

Topic EMI/ESD-1

Next generation of near-field probes and their applications in ESD, EMI, etc.

Prof. Niels Kuster

17:10-17:30

Q & A

Annie Yang

17: 30-17:40

Closing

Daniel Chang

主辦單位保有更換講師及議題之權利
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