Time | 16. September. 2011 (Friday)-Taiwan | Speaker |
9:00-9:30 | Registration & Coffee |
9:30-9:40 | Opening | Daniel Chang |
9:40-10:00 | Topic SAR-1 | Current status and future direction of SAR & HAC measurement standards:3 f6 @% v) c: L6 V: J+ ^
Specific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232 | Dr. Mark Douglas |
10:00-10:30 | Topic SAR-2 | The present SAR regulation & newest information in Japan | Dr. Nobuhiro Nakanishi |
10:30-10:50 | Coffee Break |
10:50:11:20 | Topic SAR-3 | TAF Proficiency Test Requirement, take SAR for example. | Roger Sheng |
11:20-11:40 | Topic SAR-4 | Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap phantom and whole-body phantoms, base-station phantoms | Prof. Niels Kuster |
11:40-12:00 | Topic SAR-5 | New advances in fast, reliable SAR measurement techniques | Dr. Mark Douglas |
12:00-12:20 | Topic SAR-6 | Obtaining high-precision dielectric material characterization of liquids and solids | Dr. Mark Douglas |
12:20-13:30 | Lunch & DAK Demo |
13:30-13:45 | Topic OTA-1 | Current status and future direction of CTIA 3.1 & 3GPP | Prof. Niels Kuster |
13:45-14:25 | Topic OTA-2 | PART I - CTIA OTA TEST SYSTEM+ y7 n6 B! s0 u$ V y9 K
PART II - APLUSTECH PRODUCT0 a/ O) M7 b4 T9 ]+ B
PART III - MIMO ANTENNA TEST | Kyung-ki Min |
14:25-14:40 | Topic OTA-3 | Novel OTA Phantoms | Prof. Niels Kuster |
14:40-15:10 | Topic 4G-1 | NFC Testing Challenges% c6 |* A: o( j8 m
-
: C- |6 A) W2 \! N1 d3 ~! pNFC Technology Main Features
3 Z% x: L: d& G$ F+ e2 z-
$ q4 d8 N4 p+ A9 z9 P8 I4 y2 @NFC Testing Challenges
+ f5 \$ F, s$ Z* B-$ e% h1 Q5 ^; k4 r2 F. b3 W; Y
NFC Forum Compliance Activities
! `6 o2 S' @/ z$ y-
6 J1 m( m8 s9 W4 ^$ e: u5 c* }1 R3 cRIDER RFID HF Tester | Rafael Garcia Escobar |
15:10-15:30 | Coffee Break |
15:30-16:00 | Topic 4G-2 | LTE R&D Testing
/ ]8 ]0 r5 V; G7 _' F. ]- @-& {3 n. ^1 U. I: S
LTE Design Verification Testing
`" a# u2 G6 E+ J: J/ r-
{/ _' O+ w; w S% YNeeded functionalities for R&D Testing# C O# V* K9 H/ r4 x1 W0 ^% z
-
! ^% t3 H+ A0 x# q# h5 ZLTE Mobile Application Usage Cases1 Y6 z$ b$ [4 W$ f9 N
-7 _# }- D# x) u$ _7 Q/ o& d# u
LTE RF Design Validation Tester | Rafael Garcia Escobar |
16:00-16:20 | Topic 4G-3 | SAR Measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems) | Prof. Niels Kuster |
16:20-16:40 | Topic HAC-1 | Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment | Dr. Fin Bomholt |
16:40-17:10 | Topic EMI/ESD-1 | Next generation of near-field probes and their applications in ESD, EMI, etc. | Prof. Niels Kuster |
17:10-17:30 | Q & A | Annie Yang |
17: 30-17:40 | Closing | Daniel Chang |