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In order to save test device, usually will do Power to Ground then IO to Power/Ground and the last is Io to IO. : c8 o# Y9 n, b; F9 @: C* R" X4 ?' \
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The reason is:
, m" O* g$ n: S y! C% r2 }9 g1. If power to ground can not pass, the rest combination has less chance to pass
7 a, v1 ]& o' }' v% s" V2. Usually power pin count is less than IO pin count. It is fast to get an idea how the chip's ESD level
- w1 M8 S& l% ]3. If failed, it's easy to find the failed ESD zapping combination |
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