|
Layout Guidelines for Optimized ESD Protection Diodes: d3 ?* N( |6 t1 h+ v: E+ u1 \& h
) y$ U9 [' K5 ^- t4 l% _) g; ]1 S
Karan Bhatia and Elyse Rosenbaum
3 R7 S0 t5 M- R% x: K& W" l" dDepartment of Electrical and Computer Engineering • University of Illinois at Urbana-Champaign& `# n9 q. k; [) R
1308 W. Main St., Urbana, IL 61801 • Tel. +1-217-244-0578 • Fax +1-217-244-1946 • Email: ksbhatia@uiuc.edu
/ t7 c7 [* L' M! A$ U0 ^9 s
- k9 Q5 U' Z# ]( _ ~& qAbstract - In this work, various layout options for ESD diodes’ PN junction geometry and metal routing are% @9 i, R) D8 O; r, m4 U
investigated. The current compression point (ICP) is introduced to define the maximum current handling. {0 p% F. Z2 `3 c( p
capability of ESD protection devices. The figures-of-merit ICP/C and RON*C are used to compare the, {: D5 v( z M8 O+ f0 o
performance of the structures investigated herein. |
本帖子中包含更多資源
您需要 登錄 才可以下載或查看,沒有帳號?申請會員
x
|