Abstract—Cable discharge events (CDEs) have been found # i) `( [" {- F& R g( y( B to be the major root cause of inducing hardware damage on " Q* g4 ~7 d( ~( F- E' z! j. u Ethernet ICs of communication interfaces in real applications. Still,. a! G4 |6 v( Z: y( H/ m
there is no device-level evaluation method to investigate the ro8 L8 l; D M' ]; V
bustness of complementary metal–oxide–semiconductor (CMOS) / p! `/ i- ~ P, w/ d3 n devices against a CDE for a layout optimization in silicon chips.