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發表於 2008-9-12 11:18:59
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ABCs of Probes
Table of Contents* f/ @) e3 i$ K! n- c$ P- R
Probes – The Critical Link To Measurement Quality . . . . . . . . .5
4 W! q& q/ j3 L+ o3 uWhat is a Probe? . . . . . .5
2 ?9 |) b* B& ?* ?3 h5 JThe Ideal Probe . . . . . . .6
. |6 P1 p* w5 ^7 z! [The Realities of Probes . 7: W* v4 x$ m* i9 C8 h! Y9 k8 ]
Choosing the Right Probe .10 p7 V$ g" ^5 y6 _ z
Some Probing Tips . . . .11( Q, _% v$ o/ R( T
Summary 12
2 I/ z, B- ?! ^- m9 VDifferent Probes for Different Needs . . . . . . . . .135 W, {2 \1 d3 @% I* g
Why So Many Probes? .13 y2 ~) z! q7 e9 a3 B0 t) p: k- J# q
Different Probe Types and Their Benefits . . . . . . . .14+ O; Q R$ d5 s8 ?; c
Floating Measurements .19! B+ U9 }2 o+ Q( h. n; O
Probe Accessories . . . .20
3 i" f ^8 E4 eHow Probes Affect Your Measurements . . . . . . 22- b) q7 B& d z/ U( l" B
The Effect of Source Impedance . . . . .22
, s+ V ?+ b9 Y( m& l) B$ n }& UCapacitive Loading . . . .22
6 V! w0 l6 T3 a+ f. A/ H( NBandwidth Considerations 24( Q! H( V" \/ V( x2 F* M" P
What To Do About Probing Effects . . . .28* B2 X7 y* l9 @% n
Understanding Probe Specifications . . . . . . . .29/ D5 a, Z2 y7 i$ E' G6 J$ }
Aberrations (universal) . 29- M0 f3 Z! W e6 z, C% r% c
Amp-Second Product (current probes) .29
/ i: w8 B1 q% B( ]Attenuation Factor (universal) . . . . . . .29* r y$ A( [' r w
Accuracy (universal) . . .29
- _9 I" {7 K( J! d; IBandwidth (universal) . .30
3 f. I( W6 l. I2 L! a9 h) MCapacitance (universal) .30
0 v& _. c j; H* {! X! [) q% D zCMRR (differential probes) . . . . . . . . .305 A4 q+ [% O3 j: e8 r
CW Frequency Current Derating (current probes) . . .31
: x3 x- A% y$ ]2 L4 \ hDecay Time Constant (current probes) .31
' {; K' L; s' c& _2 o) C: }+ WDirect Current (current probes) . . . . . .31
* m& a% K% Q& F/ M+ YInsertion Impedance (current probes) . .31* m7 ?5 L1 Z. Z$ a9 e; W$ J( Z
Input Capacitance (universal) . . . . . . . .310 e2 |2 e8 K; w# m! \) j
Input Resistance (universal) . . . . . . . . .31( z! a! O+ C0 U. R
Maximum Input Current Rating (current probes) . . .31) u f7 q2 T( _& d
Maximum Peak Pulse Current Rating (current probes) .31
. P0 X6 v2 d s* I% U3 Y8 C9 LMaximum Voltage Rating (universal) . . .314 S. G! Z9 U* I Q3 I4 d
Propagation Delay (universal) . . . . . . .31
/ [$ H( h9 E/ _; N8 v* RRise Time (universal) . .31
( S, Q* A p* ~7 y @7 l/ sTangential Noise (active probes) . . . . .31
8 h) P1 N6 v! W* ~( ^' ]& DTemperature Range (universal) . . . . . .31
5 r7 B/ e- N0 E& R f" p9 Z' UA Guide to Probe Selection . . . . . . .32! m# f$ l/ s: Q2 F( O3 e
Understanding the Signal Source . . . . .32
6 N' }2 O2 A# Z5 m; l* T9 FOscilloscope Issues . . .348 L$ ], [ W2 A( s; O- ]" Q0 |
Selecting the Right Probe 35, i. s4 J' w9 J r0 b# j' d, h
Advanced Probing Techniques . . . .368 r6 m* l8 L A! |
Ground Lead Issues . . .36, y4 m* U4 u: K5 M) h1 D
Differential Measurements . . . . . . . . .39
# f2 |. V; B8 N) T E# iSmall Signal Measurements . . . . . . . . 42
, M; D+ n2 r$ d5 `Explanation of Safety Precautions .44
- a# w& f% e iObserve All Terminal Ratings . . . . . . . 440 a/ A( [0 J, l" P! z
Use Proper Grounding Procedures . . . .44
: H& o& z' e8 t. a v- c0 RConnect and Disconnect Probes Properly . . . . . . . .44
& R# S) Z' R5 ~/ V) _ ~6 `/ XAvoid Exposed Circuitry . .454 N f$ e- n7 o* U# G# Y! c
Avoid RF Burns While Handling Probes .450 H) E6 n6 B2 G# k
Do Not Operate Without Covers . . . . . .452 {8 l# S3 [3 E$ w0 d0 E& d6 q
Do Not Operate in Wet/Damp Conditions . . . . . . . .456 s6 B/ ^. v& ?, k/ y
Do Not Operate in an Explosive Atmosphere . . . . . .45
/ J/ Z6 v @; }% |% K# MDo Not Operate with Suspected Failures . . . . . . . . .45
! E0 S/ Y7 i( _4 ]) GKeep Probe Surfaces Clean and Dry . . .45* x# }! a$ g5 {2 ~$ P
Do Not Immerse Probes in Liquids . . . .457 W) R' Q2 o! U& k% X' _2 |0 ]
Glossary
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