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發表於 2008-11-26 21:59:05
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IV. CONCLUSION# B! N( i& }& R1 ?* T9 v
The designs with 3-stage-inverter and 1-stage-inverter9 A/ H' K* H2 F0 u' X: F8 u: C
controlling circuits have been studied to verify the optimal
$ g2 j8 b" M, O3 @* ~6 L" adesign schemes in NMOS-based power-rail ESD clamp
4 u5 a+ O2 i2 F% `circuits. In addition, two ESD clamp NMOS transistors,
/ b6 _* s3 o9 k* Xhaving snapback and no snapback operations, also were codesigned
7 C3 Z7 v' i: {% j9 K' e7 z0 a4 pwith different controlling circuits to realize the
7 q. w3 t3 v' limpact on their required performance. According to the L Y7 s6 J4 @
experiments and analyses, the 3-stage inverters can slightly% s* L. j# F# X6 h( F. E0 m
increase the ESD robustness, but they also can dramatically8 A% E7 l( Z0 p- K4 y
sacrifice the mis-trigger and latch-on immunity. The 1-stage) m ^! G ~) S
inverter should be an appropriate and reliable candidate for the
5 j" q% L7 r0 v0 x3 T& ]+ kpower-rail ESD clamp circuits. |
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