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發表於 2008-9-12 11:18:59
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ABCs of Probes
Table of Contents0 c& \- ]) y9 p7 \+ `# B7 @
Probes – The Critical Link To Measurement Quality . . . . . . . . .5: u+ |* \# Q; i
What is a Probe? . . . . . .57 _4 X1 y, H6 j4 b" P
The Ideal Probe . . . . . . .6
0 f3 J- z# G, wThe Realities of Probes . 75 V! a2 D: G, e& v1 e4 \
Choosing the Right Probe .10
6 H& j7 m: ~9 X- }0 g* Q- Q8 ~Some Probing Tips . . . .11: ?; J" P5 b* N+ H2 k
Summary 12
7 w1 R6 z* \ p5 h9 fDifferent Probes for Different Needs . . . . . . . . .13
. m( @5 g' Q9 t, j* ^Why So Many Probes? .134 i. e- O* Z0 O n& N% l5 P: Y0 g
Different Probe Types and Their Benefits . . . . . . . .142 h+ K& Y+ `5 X) E+ S
Floating Measurements .19
2 E1 [8 K6 F8 E# r5 a+ NProbe Accessories . . . .20( x- I0 I) r: ?3 a5 a8 T
How Probes Affect Your Measurements . . . . . . 22
2 X; i4 M8 a2 x# p; N; H: K3 n# ]The Effect of Source Impedance . . . . .22
6 ?/ q0 q# S$ FCapacitive Loading . . . .22* r* Q; l3 ]/ e) d- q
Bandwidth Considerations 24& T, f" ]5 o. I* O
What To Do About Probing Effects . . . .28
" S5 f1 o# |2 U! Y: t* nUnderstanding Probe Specifications . . . . . . . .29: @/ O' D; Y) |+ c8 `6 m4 L
Aberrations (universal) . 294 A/ R* T: J0 G7 ^' Z
Amp-Second Product (current probes) .293 V% o# P2 a+ Y, F
Attenuation Factor (universal) . . . . . . .29
/ `. t6 C9 C6 }+ uAccuracy (universal) . . .29
9 U3 A5 ]9 G! A7 q- X, xBandwidth (universal) . .302 s! x8 N5 a1 o$ N4 G- a. @$ f2 S7 k
Capacitance (universal) .30: {. G3 q5 ~% Z5 p9 @; C- d# n- R z3 k1 r
CMRR (differential probes) . . . . . . . . .301 G$ s' [5 X) w! q9 ^" W
CW Frequency Current Derating (current probes) . . .31- k. u* C# {7 }* _8 r% U( G
Decay Time Constant (current probes) .31( j3 {3 r3 x2 k4 d* r, g4 o+ _. f
Direct Current (current probes) . . . . . .31
* l+ o2 I. a* s1 vInsertion Impedance (current probes) . .31
6 s7 x6 b! S N$ h; kInput Capacitance (universal) . . . . . . . .31
* |9 `& U" G4 I5 \4 p+ tInput Resistance (universal) . . . . . . . . .312 [9 ~. B/ u S! ?
Maximum Input Current Rating (current probes) . . .313 ?* M3 `* a# m+ O
Maximum Peak Pulse Current Rating (current probes) .31
! N) \6 a ?% V- L Y) WMaximum Voltage Rating (universal) . . .31. E' u2 R4 ~5 {& w9 i
Propagation Delay (universal) . . . . . . .31( G0 H) X4 R/ T; ]& ?, F$ h0 k) T
Rise Time (universal) . .31$ }* R; J1 F$ V( b, k
Tangential Noise (active probes) . . . . .316 n! h4 k1 R. s% Y' k% O
Temperature Range (universal) . . . . . .31
# D+ `' d+ o7 v7 C5 `. bA Guide to Probe Selection . . . . . . .32
$ o4 W4 g3 T3 s5 e2 hUnderstanding the Signal Source . . . . .32' a! t# B+ N8 M
Oscilloscope Issues . . .34; T0 R% t6 I& ]+ i# v5 b/ x) y
Selecting the Right Probe 35% f) V0 S' y) h1 D: y" |& P
Advanced Probing Techniques . . . .36
8 ~: S7 R3 k+ E* }Ground Lead Issues . . .366 F3 V$ M# y* ~+ h3 r
Differential Measurements . . . . . . . . .39
) P3 [ J* B9 F9 ~$ z3 _Small Signal Measurements . . . . . . . . 42! x; D; _8 o1 f* o* w0 f2 \. q# A
Explanation of Safety Precautions .44
* ]8 i* l9 I0 k( E/ \; [0 v9 TObserve All Terminal Ratings . . . . . . . 44, ^9 H u1 C, Y' e0 A
Use Proper Grounding Procedures . . . .44
# i( A `, q! x6 Q- i% @$ UConnect and Disconnect Probes Properly . . . . . . . .44
0 J# R( x) v3 B) n# eAvoid Exposed Circuitry . .458 ~9 V t$ \' B( I! [# y
Avoid RF Burns While Handling Probes .45
9 A+ ]2 k: w2 z- q1 f' G# TDo Not Operate Without Covers . . . . . .45
% B. Y, c& J2 i; m9 nDo Not Operate in Wet/Damp Conditions . . . . . . . .454 N" Z0 W0 O3 M7 w
Do Not Operate in an Explosive Atmosphere . . . . . .45
* |4 m( v6 I6 O& k) gDo Not Operate with Suspected Failures . . . . . . . . .45( J4 z3 N U3 |5 R
Keep Probe Surfaces Clean and Dry . . .450 G! [! z6 ~: B2 f6 h' k
Do Not Immerse Probes in Liquids . . . .45
; G" u% [) i6 B: }# aGlossary
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