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發表於 2008-11-26 21:59:05
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IV. CONCLUSION
* g- o4 V' z/ K9 ~5 j: NThe designs with 3-stage-inverter and 1-stage-inverter
0 x- o ?% r! j3 _1 ^# F: qcontrolling circuits have been studied to verify the optimal) p+ ~) V2 Q i% M
design schemes in NMOS-based power-rail ESD clamp* @* r- v' G9 [0 J; {+ ]8 p$ h9 h. |
circuits. In addition, two ESD clamp NMOS transistors,' ~6 w9 {2 a9 T$ F
having snapback and no snapback operations, also were codesigned9 E( h' s {. V
with different controlling circuits to realize the8 M- n, g5 f% ~1 t9 F
impact on their required performance. According to the
7 I( G9 E4 T" U& K3 V9 O/ Vexperiments and analyses, the 3-stage inverters can slightly% G% N* K. L( l; N# I, c* @
increase the ESD robustness, but they also can dramatically
8 @! ^1 ^' w$ asacrifice the mis-trigger and latch-on immunity. The 1-stage$ K$ z, @3 S( ~3 Y
inverter should be an appropriate and reliable candidate for the
5 E( m7 u- [" I2 t6 ]power-rail ESD clamp circuits. |
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