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Call for Papers Announcement
e-Manufacturing & DFM Symposium 2008 (AJoint Symposium with AEC/APC-Asia Symposium 2008) hosted by TSIA will be held on November 27-28, 2008 at Ambassador Hotel HsinChu. Please submit your abstract to symposia@tsia.org.tw.$ A" }! b6 X- g+ S2 N
Topics of interests include, but not limited to, the following:! q+ J& G6 @: j3 C2 g+ t0 N$ s
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Applications in high-volume manufacturing0 u% ^( W$ h Y: e5 G4 ^6 L1 g
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% n7 h8 R9 e \: j& Q+ w, [Automated Material Handling System8 ]- _* i2 q3 I, {( n, j
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& I4 h1 X% l3 a/ A4 dBenefits and justification (ROI, CoO, OEE…)
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& m6 ]' B. J$ C) AControl Architecture/Engineering/IT Infrastructure) C8 A. }& u' m9 i( D H3 s
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* ]5 X, E. o0 W- M4 TData Collection/Quality/Storage/Management
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Design for Manufacturing/Testing/Yield$ g: k+ W" F+ Y! [* K: t0 T7 ^
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! Y( J! [6 ^5 S. Y: o2 j; me-Diagnostics, e-Manufacturing, and EEC
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Engineering/Supply/Value Chains
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+ x) k8 ^$ D% l2 |8 FEquipment Communication/Integration
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Factory Integration/Operations; B" t# X* J# e7 M S
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Factory-Wide Applications and Deployment3 f2 a3 X% i9 a) t, w) s8 H" N! ^" g
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: z* H1 L+ Y+ D% u' RFault Detection & Classification
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5 ?/ v0 w6 ^) yFuture APC/FDC Needs and Requirements
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. _5 x! f. D: JIntegrated/Virtual Metrology7 O* W. {! f5 ^+ Z X! _
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Manufacturing Execution Systems
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: m$ d2 l1 D* nReal-Time & Defect/Yield Databases
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$ X8 \3 g5 T; h: ^! LPiggyback and SCADA controllers+ C1 h. x- v, Q8 g
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Predictive/Preventive Maintenance5 M! s! Z! H7 C( T1 D
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Process modeling and model-based control
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6 [2 R% H s7 p {( xReal-time data collection and management
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s& I( V8 B1 N( c8 B! k0 oReal-Time Decision-Making& X- B \) ?! b- N& v0 P( m4 I
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Run-to-Run/Wafer-to-Wafer/Real-Time Control
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Scheduling & Dispatching7 n/ Y6 M& U% m
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Sensor development and implementation) {* O V% ^) X" g. h* _
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- ~. R8 _% U7 H) `% ]Sensor integration into existing process tools2 n0 X& C. ?4 V+ h! I# w' M
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& K; i J& X) A; K KSensor/actuator bus and intelligent sensors
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) _$ E& u% D& |( VSpecification Management' X. m P6 @9 `1 ^6 M
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0 F* |' w- S8 s+ J$ NStandards (Communication, Sensor Bus…)
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# b/ @' f" I8 xTool Productivity Data Collection/Analysis; |0 Y1 F% K1 W! T8 {' \! a- @: G- W
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# b- u( C! j0 }+ f4 QWIP Management
# o6 H& ?- }0 k) A R' {# Y Please consider the following important dates: 1 k$ U" f) Q0 }2 _
Deadline of abstract submission : July 1, 20080 F/ D5 @9 V T9 Z' ], p( y
Notification of accetpance : August 22, 2008
0 o" p4 x$ r s2 w$ \' O* I Final paper due : October 20, 20080 b# Z) Y& m6 ?3 X% c( [
Deadline of early registration : October 20, 2008 9 Z! n5 W" K3 _( y: I4 `( ?4 w
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If any question, please contact with Celia Shih 石英堂
9 k9 P. F- R# Z3 KTaiwan Semiconductor Industry Association
! L4 O) N' C) E& p6 ?台灣半導體產業協會5 n& d$ k/ H5 T0 i
Tel : +886-3-5917092
2 X" _/ n. p( q, y7 Y8 VFax: +886-3-5820056 |
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