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e-Manufacturing & DFM Symposium 4/1開放報名

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發表於 2007-3-27 14:57:21 | 只看該作者 回帖獎勵 |倒序瀏覽 |閱讀模式
Keynote邀請到前清大校長劉炯朗擔任
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    This is the first e-Manufacturing symposium organized by Taiwan Semiconductor Industry Association (TSIA) aiming to forge stronger links between the Academia and the Industry on complementary and collaborative efforts in maintaining the national leading edge competitive advantages and capabililities among the world's manufacturing bases.0 y# r& r/ A+ y
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  The Symposium initiates to offer a common arena for academics and professionals of business operators, concept creators, product designers, commondity manufacturers, hardware suppliers, software vendors, independent consultants, network distributors and logistics controllers to exchange fundamental concerns, to discuss immediate outlooks and future trends, and to explore the uncharted territories altogether.
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發表於 2008-2-18 11:22:29 | 只看該作者

Call for Papers Announcement

e-Manufacturing & DFM Symposium 2008 (AJoint Symposium with AEC/APC-Asia Symposium 2008) hosted by TSIA will be held on November 27-28, 2008 at Ambassador Hotel HsinChu. Please submit your abstract to symposia@tsia.org.tw.$ A" }! b6 X- g+ S2 N
Topics of interests include, but not limited to, the following:! q+ J& G6 @: j3 C2 g+ t0 N$ s
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Applications in high-volume manufacturing0 u% ^( W$ h  Y: e5 G4 ^6 L1 g
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Automated Material Handling System8 ]- _* i2 q3 I, {( n, j
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Benefits and justification (ROI, CoO, OEE…)
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Control Architecture/Engineering/IT Infrastructure) C8 A. }& u' m9 i( D  H3 s
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Data Collection/Quality/Storage/Management
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Design for Manufacturing/Testing/Yield$ g: k+ W" F+ Y! [* K: t0 T7 ^
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e-Diagnostics, e-Manufacturing, and EEC
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Engineering/Supply/Value Chains
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Equipment Communication/Integration
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Factory Integration/Operations; B" t# X* J# e7 M  S
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Factory-Wide Applications and Deployment3 f2 a3 X% i9 a) t, w) s8 H" N! ^" g
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Fault Detection & Classification
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Future APC/FDC Needs and Requirements
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Integrated/Virtual Metrology7 O* W. {! f5 ^+ Z  X! _
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Manufacturing Execution Systems
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Real-Time & Defect/Yield Databases
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Piggyback and SCADA controllers+ C1 h. x- v, Q8 g
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Predictive/Preventive Maintenance5 M! s! Z! H7 C( T1 D
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Process modeling and model-based control
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Real-time data collection and management
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Real-Time Decision-Making& X- B  \) ?! b- N& v0 P( m4 I
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Run-to-Run/Wafer-to-Wafer/Real-Time Control
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Scheduling & Dispatching7 n/ Y6 M& U% m
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Sensor development and implementation) {* O  V% ^) X" g. h* _
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Sensor integration into existing process tools2 n0 X& C. ?4 V+ h! I# w' M
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Sensor/actuator bus and intelligent sensors
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Specification Management' X. m  P6 @9 `1 ^6 M
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Standards (Communication, Sensor Bus…)
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Tool Productivity Data Collection/Analysis; |0 Y1 F% K1 W! T8 {' \! a- @: G- W
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WIP Management
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Please consider the following important dates: 1 k$ U" f) Q0 }2 _
            Deadline of abstract submission : July 1, 20080 F/ D5 @9 V  T9 Z' ], p( y
            Notification of accetpance : August 22, 2008
0 o" p4 x$ r  s2 w$ \' O* I            Final paper due : October 20, 20080 b# Z) Y& m6 ?3 X% c( [
            Deadline of early registration : October 20, 2008 9 Z! n5 W" K3 _( y: I4 `( ?4 w
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If any question, please contact with Celia Shih  石英堂
9 k9 P. F- R# Z3 KTaiwan Semiconductor Industry Association
! L4 O) N' C) E& p6 ?台灣半導體產業協會5 n& d$ k/ H5 T0 i
Tel : +886-3-5917092
2 X" _/ n. p( q, y7 Y8 VFax: +886-3-5820056
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