Chip123 科技應用創新平台

 找回密碼
 申請會員

QQ登錄

只需一步,快速開始

Login

用FB帳號登入

搜索
1 2 3 4
查看: 6226|回復: 9
打印 上一主題 下一主題

Layout Optimization on ESD Diodes for Giga-Hz RF and High-Speed I/O Circuits

  [複製鏈接]
跳轉到指定樓層
1#
發表於 2010-6-25 08:49:05 | 顯示全部樓層 回帖獎勵 |倒序瀏覽 |閱讀模式
Layout Optimization on ESD Diodes for Giga-Hz RF and High-Speed I/O Circuits5 s' F. U" M- c# X

' a5 b. y% s- a. m8 y! Z7 _6 v* S
遊客,如果您要查看本帖隱藏內容請回復

本帖子中包含更多資源

您需要 登錄 才可以下載或查看,沒有帳號?申請會員

x
分享到:  QQ好友和群QQ好友和群 QQ空間QQ空間 騰訊微博騰訊微博 騰訊朋友騰訊朋友
收藏收藏1 分享分享 頂1 踩 分享分享
2#
 樓主| 發表於 2010-6-25 08:50:33 | 顯示全部樓層
Abstract -- The diode operated in forward-biased condition has5 G2 T' X- C6 u  a( g
been widely used as an effective on-chip ESD protection device at6 Z! }0 a' N8 A
GHz RF and high-speed I/O pads due to the small parasitic
: o) X; [6 c- s3 _& }loading effect and high ESD robustness in CMOS integrated
, S! L2 y; e% [7 X2 c5 R! T8 z( gcircuits (ICs). This work presents new ESD protection diodes
) w* a' T2 s  Crealized in the octagon, waffle-hollow, and octagon-hollow layout. Y0 P6 K2 W. l' ^% l3 n6 s9 E
styles to improve the efficiency of ESD current distribution and
% ~) R. {$ b) d6 Nto reduce the parasitic capacitance. The new ESD protection9 [; N  Z5 i4 P2 S2 s4 t
diodes can achieve smaller parasitic capacitance under the same  e1 F0 r% v1 X4 w+ `2 G
ESD robustness level as compared to the waffle diode. Therefore,0 J; F: h9 z# c) w3 a  t$ C
the signal degradation of GHz RF and high-speed transmission9 d0 U7 L( I% I  L
can be reduced due to smaller parasitic capacitance from the new$ ~8 E) o3 l% b0 k. z
proposed diodes.
您需要登錄後才可以回帖 登錄 | 申請會員

本版積分規則

首頁|手機版|Chip123 科技應用創新平台 |新契機國際商機整合股份有限公司

GMT+8, 2024-5-4 07:37 AM , Processed in 0.100006 second(s), 17 queries .

Powered by Discuz! X3.2

© 2001-2013 Comsenz Inc.

快速回復 返回頂部 返回列表