Time | Title |
13:00 ~ 13:20 | # |" X2 y4 f7 }3 ]
Registration2 \6 C, g6 u+ \5 K, B1 [6 o4 R5 X
報到 |
13:20 ~ 13:30 | 5 n3 l! _$ b% f; }' P7 j$ ?
Opening
0 x a$ K$ F4 Z% p; B# S; ]- V開場 |
13:30 ~ 14:00 |
& r* p" n6 f& S) bPXI Interoperability1 e, K V* i& M
PXI 模組互通性之探究 |
14:00 ~ 14:50 |
+ g8 n3 K$ j6 g0 i$ GFundamentals of High-Speed Digitizers
/ C7 _ A3 S% |高速數位轉換器理論基礎與應用 |
14:50 ~ 15:10 |
. g: o/ {+ M) h" S( n8 r- \: pTea Break
4 i% k$ ]( v7 Y" a% T$ ^中場休息 |
15:10 ~ 15:40 |
V2 F+ i9 K j; `Fundamentals of High-Speed data Throughput in PXI0 @1 Z4 k& a1 W! f$ f" H: x o
PXI 系統高速資料傳輸之剖析 |
15:40 ~ 16:30 |
" v0 @: I% l u- `9 l ^2 o$ ?" KElectronic functional test best practices - Methods to achieve accurate, reliable measurements in electronic functional test applications
! e+ Q3 b3 `$ @+ t電子功能性測試最佳實務:實現準確、可靠的電子功能性測試應用 |