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In order to save test device, usually will do Power to Ground then IO to Power/Ground and the last is Io to IO. 3 x) M8 ]+ L$ N' N9 G O) |
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The reason is:
5 {9 o! l% o) d( z, L% G; J' Z1. If power to ground can not pass, the rest combination has less chance to pass
- g! a) o9 o+ F, l. ~2 ]# p2. Usually power pin count is less than IO pin count. It is fast to get an idea how the chip's ESD level, [+ {# Q p+ ~
3. If failed, it's easy to find the failed ESD zapping combination |
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IP卡
狗仔卡
發表於 2009-7-18 01:39:29
顯身卡