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發表於 2008-11-6 20:40:28
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Abstract—Cable discharge events (CDEs) have been found9 I- @, V) i+ o! q9 C
to be the major root cause of inducing hardware damage on3 m" v- S+ f* I6 K
Ethernet ICs of communication interfaces in real applications. Still,
2 U( e, s2 o. L1 E! a( e8 t+ h6 l there is no device-level evaluation method to investigate the ro
6 T2 i6 S& @2 U% N7 ~- O bustness of complementary metal–oxide–semiconductor (CMOS)9 R9 v" ^9 F* L E" a+ v( |
devices against a CDE for a layout optimization in silicon chips. |
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