標題: ESD的另一种情况：CDE（Cable Discharge Event） [打印本頁] 作者: semico_ljj 時間: 2008-11-6 08:39 PM 標題: ESD的另一种情况：CDE（Cable Discharge Event） ESD的另一种情况：CDE ) \+ @* c$ G* w% H- aCDE--Cable Discharge Event 5 E7 J2 l/ F! P7 r" S: Z% G/ x: x; i- \) K8 `
Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology: i' Q5 ?" @) ^2 g
" m$ c! G# D0 d5 M* Z2 r 作者: semico_ljj 時間: 2008-11-6 08:40 PM
Abstract—Cable discharge events (CDEs) have been found 8 |6 ~8 U. h7 [2 ?8 _) Z1 f) M! g to be the major root cause of inducing hardware damage on4 Y& N$ q7 V7 t0 I- F! f+ {6 O
Ethernet ICs of communication interfaces in real applications. Still, : ]/ N( r: _# d# w" A there is no device-level evaluation method to investigate the ro " l' {& f7 Z# O$ u0 H8 L bustness of complementary metal–oxide–semiconductor (CMOS) * S V/ F Q3 S devices against a CDE for a layout optimization in silicon chips.作者: semico_ljj 時間: 2008-11-6 08:41 PM
谢谢支持！作者: hansonzhao 時間: 2008-12-3 04:49 PM
好冬冬，楼主辛苦了 % H2 g3 x& b8 f/ V0 b& p6 T希望楼主多多提供
