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標題: 9/16 2011 無線終端產品量測技術研討會 [打印本頁]
作者: mister_liu    時間: 2011-8-31 12:15 PM
標題: 9/16 2011 無線終端產品量測技術研討會
－無線終端產品測試:SAR、OTA、4G、HAC & EMI/ESD - i9 P/ |. ~3 M. [. C- E
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為探討全球性通信資訊市場發展趨勢，使業界先進對電磁量測儀表(DASY, iSAR, OTA等)更廣泛瞭解，並熟悉相關配套量測工具之實際操作情形，及介紹新一代行動無線寬頻技術。耀豋科技秉持服務客戶精神，於2011年首度舉辦「無線終端產品量測技術研討會」，於會中分享CTIA最新法規與發展、SAR, HAC, LTE, NFC測量技術及最新測試功能，誠摯邀請您與我們共襄盛舉！
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主辦單位：Schmid & Partner Engineering AG, Aplustech AT4 wireless,  Auden Techno. Corp. 耀登科技股份有限公司    : X* |/ v) }! m6 H! ?" A
【會議地點及時間】：       
8 g5 a/ ~+ G& a4 W9 xDate： 16.September.2011 (Friday)
# n. H' R1 ?0 ETime： 9:00 AM ~ 17:30 PM+ k# {0 E, c4 a
Location：Grand Victoria Hotel- 168 Jing Ye 4th Rd, Taipei 104  TEL02)8502-0000  
$ M' T- G, i, o7 _8 s) S( hContact information: Auden Techno. Corp. Equipment Marketing Dept.
! Q7 L* Z. v3 |; s8 W" y  R$ v       TEL: (03) 3631901 or E-mail Ins@auden.com.tw
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活動費用: 全程免費(提供午餐餐盒、講義、茶點、水果)
作者: mister_liu    時間: 2011-8-31 12:15 PM

Time

16. September. 2011 (Friday)-Taiwan

Speaker

9:00-9:30

Registration & Coffee

9:30-9:40

Opening

Daniel Chang

9:40-10:00

Topic SAR-1

Current status and future direction of SAR & HAC measurement standards:  ^, s) ~% _5 T9 B! ~
Specific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232

Dr. Mark Douglas

10:00-10:30

Topic SAR-2

The present SAR regulation & newest information in Japan

Dr. Nobuhiro Nakanishi

10:30-10:50

Coffee Break　

10:50:11:20

Topic SAR-3

TAF Proficiency Test Requirement, take SAR for example.

Roger Sheng

11:20-11:40

Topic SAR-4

Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap phantom and whole-body phantoms, base-station phantoms

Prof. Niels Kuster

11:40-12:00

Topic SAR-5

New advances in fast, reliable SAR measurement techniques

Dr. Mark Douglas

12:00-12:20

Topic SAR-6

Obtaining high-precision dielectric material characterization of liquids and solids

Dr. Mark Douglas

12:20-13:30

Lunch & DAK Demo　

13:30-13:45

Topic OTA-1

Current status and future direction of CTIA 3.1 & 3GPP

Prof. Niels Kuster

13:45-14:25

Topic OTA-2

PART I - CTIA OTA TEST SYSTEM- I9 o* V, ^: P  J1 `: J1 U$ a
PART II - APLUSTECH PRODUCT
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Kyung-ki Min

14:25-14:40

Topic OTA-3

Novel OTA Phantoms

Prof. Niels Kuster

14:40-15:10

Topic 4G-1

NFC Testing Challenges
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NFC Testing Challenges3 C; {7 |( M4 K  n7 |$ n0 K, ?
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0 W' [) A, o4 ^  uNFC Forum Compliance Activities+ M, N( C4 `" ?7 ]
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RIDER RFID HF Tester

Rafael Garcia Escobar

15:10-15:30

Coffee Break　

15:30-16:00

Topic 4G-2

LTE R&D Testing6 ?+ a% C) U! {, s7 m( J) G
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LTE Design Verification Testing
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Needed functionalities for R&D Testing* X" B1 W2 u$ E8 w8 J0 Z/ q) f
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LTE Mobile Application Usage Cases
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LTE RF Design Validation Tester

Rafael Garcia Escobar

16:00-16:20

Topic 4G-3

SAR Measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems)

Prof. Niels Kuster

16:20-16:40

Topic HAC-1

Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment

Dr. Fin Bomholt

16:40-17:10

Topic EMI/ESD-1

Next generation of near-field probes and their applications in ESD, EMI, etc.

Prof. Niels Kuster

17:10-17:30

Q & A

Annie Yang

17: 30-17:40

Closing

Daniel Chang

※ 主辦單位保有更換講師及議題之權利



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