標題: 请教ESD测试顺序 [打印本頁] 作者: scy8080 時間: 2009-6-24 02:20 PM 標題: 请教ESD测试顺序 在ESD测试时，有三种测试组合：I/O对电源/地、I/O对I/O、电源对地，这几种组合有没有测试顺序？比如说先测试电源对地，再测试I/O对电源/地，最后是IO对I/O。作者: scy8080 時間: 2009-6-24 02:40 PM
用相對I-V漂移故障判断方法时，I-V曲线又是如何得到的？是将电源地接到一起来，然后对I/O加电压，得到电流对电压的曲线，还是将其他的I/O和电源/地接到一起哪？ ) \1 u7 V2 C4 Z, P2 T! ~对此比较困惑，望各位达人解惑，谢谢作者: daidai 時間: 2009-6-27 01:54 PM
Because all tests need to pass, so I think there is no fixed sequence. Normally, 电源对地 --> I/O对电源/地 --> I/O对I/O is recommended because this is general strength sequence of ESD immunity. For your reference.作者: daidai 時間: 2009-6-27 01:56 PM
用相對I-V漂移故障判断方法时，是将电源地接到一起来，然后对I/O加电压，得到电流对电压的曲线.作者: wesleysungisme 時間: 2009-7-18 01:39 AM
In order to save test device, usually will do Power to Ground then IO to Power/Ground and the last is Io to IO. " U2 D7 y( A- \# Y' C) K
6 i3 Y& l2 ~8 t; i1 X; dThe reason is:+ h- C' |4 E: J! S
1. If power to ground can not pass, the rest combination has less chance to pass ; v2 {+ e1 x) x4 `' @0 E5 W2. Usually power pin count is less than IO pin count. It is fast to get an idea how the chip's ESD level L j- j8 S/ n0 A* E. B# y. `% g3. If failed, it's easy to find the failed ESD zapping combination