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標題: CMOS工艺下bandgap 负温度系数器件,为什么使用PNP管而不是用二极管? [打印本頁]

作者: scy8080    時間: 2012-2-3 02:59 PM
標題: CMOS工艺下bandgap 负温度系数器件,为什么使用PNP管而不是用二极管?
CMOS工艺下bandgap 负温度系数器件,为什么使用PNP管而不是用二极管?
作者: hoodlum    時間: 2012-2-3 10:59 PM
小弟的看法是) K- J& V4 T' \9 ~
會不會是標準CMOS的製程裡
! b/ }2 o7 C: o' O4 u3 O9 K無法做出二極體, 只能用寄生的7 c! _% W' J% B
vertical PNP呢???
作者: leo911759    時間: 2012-2-8 04:02 PM
其實也是有的。
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有一些Paper就是用Diode,或是NPN。
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而會用PNP 是因為早期CMOS製程中,只能寄生等效PNP電路。
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8 x( n# v6 `- H4 h, G其中的寄生等效Diode會有Latch-up的問題。
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這是製程受限的關係,比較先進的製程就沒這種問題了。
作者: patrick02046    時間: 2012-2-9 01:24 PM
在EDA Board 抓的資訊, 參考一下:
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0 y$ y! w- C( II believe that what you are getting at is that there is a specific structure of P+/Nwell/Psub that is used for
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" \  \8 _5 O, Tthe "bipolar", so you are asking why use that structure rather than simply a P+/Nwell "diode". Here is my take 3 N! m4 |# V8 H7 A; T5 x6 J
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- r2 Z: B2 |" R* u1- The "bipolar" will simulate more accurately than the "diode", since it will include the substrate current 5 d9 ]- N) J% k! @

! Z  G  G+ T$ Othat is probably not modeled for the "diode".- F/ h' o/ u. D1 S+ c1 h
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2- There usually is a specific structure for the "bipolar" that has characterization data available. When $ W6 h! {" ]0 w( g+ C
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building a bandgap structure, the good characterization is needed in order to properly determine the tempco of
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. E: @( c! R0 u1 ^3 U3 V, [9 ithe Base-emitter voltage.
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! v/ J/ S/ t! X. N% N6 }6 r' Y3- The additional structure of the bipolar should help prevent current injection into other substrate tied
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devices.  A2 \  J% {2 v1 n
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  F: @8 F6 G% [/ U3 i1 m5 u- cThere is, of course, nothing preventing the use of a P+/Nwell diode in your application.
作者: luckyhuihui666    時間: 2012-4-13 08:06 PM
主要原因就是二极管不准确……




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