Chip123 科技應用創新平台

標題: 9/16 2011 無線終端產品量測技術研討會 [打印本頁]

作者: mister_liu    時間: 2011-8-31 12:15 PM
標題: 9/16 2011 無線終端產品量測技術研討會
-無線終端產品測試:SAR、OTA、4G、HAC & EMI/ESD
- A* G3 F2 o1 n% J- a7 \1 W
* |1 @' a; T# W為探討全球性通信資訊市場發展趨勢,使業界先進對電磁量測儀表(DASY, iSAR, OTA等)更廣泛瞭解,並熟悉相關配套量測工具之實際操作情形,及介紹新一代行動無線寬頻技術。耀豋科技秉持服務客戶精神,於2011年首度舉辦「無線終端產品量測技術研討會」,於會中分享CTIA最新法規與發展、SAR, HAC, LTE, NFC測量技術及最新測試功能,誠摯邀請您與我們共襄盛舉!! k; C; o% x; J; T# P" ]
5 T3 h7 m" R9 y; j- U
主辦單位:Schmid & Partner Engineering AG, Aplustech AT4 wireless,  Auden Techno. Corp. 耀登科技股份有限公司    ( U' V; D4 I! S. U& X, A1 u! ?
【會議地點及時間】:       
+ Q% |9 K0 n1 N, Q+ gDate: 16.September.2011 (Friday)
: K8 P: _3 k. Q/ U; e$ @5 _* H0 xTime: 9:00 AM ~ 17:30 PM
4 y/ y) R  b& B. s, g& O5 DLocation:Grand Victoria Hotel- 168 Jing Ye 4th Rd, Taipei 104  TEL02)8502-0000  
. o5 S* z6 G5 t/ eContact information: Auden Techno. Corp. Equipment Marketing Dept.! F& o/ \% \# O' P0 T
       TEL: (03) 3631901 or E-mail Ins@auden.com.tw9 Z3 ?+ |+ o, @
       Ext: 134 Stella  E-mail: Stella.huang@auden.com.tw: b2 B) E2 D) t* b' b1 w, }
活動費用: 全程免費(提供午餐餐盒、講義、茶點、水果)
作者: mister_liu    時間: 2011-8-31 12:15 PM

Time

16. September. 2011 (Friday)-Taiwan

Speaker

9:00-9:30

Registration & Coffee

9:30-9:40

Opening

Daniel Chang

9:40-10:00

Topic SAR-1

Current status and future direction of SAR & HAC measurement standards:
. G8 Q" }9 E; D( {8 r7 jSpecific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232

Dr. Mark Douglas

10:00-10:30

Topic SAR-2

The present SAR regulation & newest information in Japan

Dr. Nobuhiro Nakanishi

10:30-10:50

Coffee Break 

10:50:11:20

Topic SAR-3

TAF Proficiency Test Requirement, take SAR for example.

Roger Sheng

11:20-11:40

Topic SAR-4

Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap phantom and whole-body phantoms, base-station phantoms

Prof. Niels Kuster

11:40-12:00

Topic SAR-5

New advances in fast, reliable SAR measurement techniques

Dr. Mark Douglas

12:00-12:20

Topic SAR-6

Obtaining high-precision dielectric material characterization of liquids and solids

Dr. Mark Douglas

12:20-13:30

Lunch & DAK Demo 

13:30-13:45

Topic OTA-1

Current status and future direction of CTIA 3.1 & 3GPP

Prof. Niels Kuster

13:45-14:25

Topic OTA-2

PART I - CTIA OTA TEST SYSTEM
8 z5 D2 \" a) B  FPART II - APLUSTECH PRODUCT
6 u  v7 I4 L  h) ?0 X8 i% cPART III - MIMO ANTENNA TEST

Kyung-ki Min

14:25-14:40

Topic OTA-3

Novel OTA Phantoms

Prof. Niels Kuster

14:40-15:10

Topic 4G-1

NFC Testing Challenges- `% E- u5 ]+ o* M( H( E
-
$ Q; r4 {  T& ^0 v/ S0 {- SNFC Technology Main Features, S% c9 t3 B, _
-, z2 o$ L- ]0 }2 _. D. V
NFC Testing Challenges/ z) {# m: _% }5 ]/ B( T, Z: @0 m6 v
-
* v2 J3 Q6 E+ U9 y: I9 x) ^4 }; gNFC Forum Compliance Activities! n$ T1 @- A8 b$ `& k" P% b8 Z
-; M$ f2 v+ Y. G
RIDER RFID HF Tester

Rafael Garcia Escobar

15:10-15:30

Coffee Break 

15:30-16:00

Topic 4G-2

LTE R&D Testing% B# E/ J+ d. m# }# k1 I+ a9 W8 p
-
+ q4 W3 @# H% w- C# jLTE Design Verification Testing% ]5 ]- ~# W  z+ x; h% ], A% y
-
9 }" i6 _9 Z$ V2 D1 J6 d1 gNeeded functionalities for R&D Testing
% P$ n) D( ?# t4 g" \6 V4 N' k5 r-. I% m- G$ j0 k' x! J% H
LTE Mobile Application Usage Cases( P  \) I1 w3 l# h1 n( T& z
-% N) M6 M% n" O# r  B
LTE RF Design Validation Tester

Rafael Garcia Escobar

16:00-16:20

Topic 4G-3

SAR Measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems)

Prof. Niels Kuster

16:20-16:40

Topic HAC-1

Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment

Dr. Fin Bomholt

16:40-17:10

Topic EMI/ESD-1

Next generation of near-field probes and their applications in ESD, EMI, etc.

Prof. Niels Kuster

17:10-17:30

Q & A

Annie Yang

17: 30-17:40

Closing

Daniel Chang

主辦單位保有更換講師及議題之權利




歡迎光臨 Chip123 科技應用創新平台 (http://www.chip123.com/) Powered by Discuz! X3.2